An analytical study of the pulsed thermography defect detection limit

Darryl P Almond; Simon G Pickering

doi:10.1063/1.4704684

An analytical study of the pulsed thermography defect detection limit

Darryl P Almond, Simon G Pickering

Department of Mechanical Engineering

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Abstract

A simple modification of the one-dimensional expression for the thermal contrast of a layer provides a useful prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The new analytical results have been shown to agree with numerical modelling. The thermographic nondestructive evaluation (NDE) rule-of-thumb that defects are detected if aspect ratio exceeds two is shown to have no general validity as peak contrast is found to depend critically on defect depth and absorbed excitation energy as well as defect aspect ratio. The effects of thermal diffusivity anisotropy are included in the analysis and illustrated by simulations of defect image contrast in composite materials.

Original language	English
Article number	093510
Number of pages	9
Journal	Journal of Applied Physics
Volume	111
Issue number	9
DOIs	https://doi.org/10.1063/1.4704684
Publication status	Published - 1 May 2012

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Almond_-_Pulsed_thermography_defect_detection_limit.pdf
Copyright (2012) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Almond, D. P. and Pickering, S. G., 2012. An analytical study of the pulsed thermography defect detection limit. Journal of Applied Physics, 111 (9), 093510, and may be found at http://dx.doi.org/10.1063/1.4704684
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An analytical study of the pulsed thermography defect detection limit

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