An analytical study of the pulsed thermography defect detection limit

Darryl P Almond, Simon G Pickering

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Abstract

A simple modification of the one-dimensional expression for the thermal contrast of a layer provides a useful prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The new analytical results have been shown to agree with numerical modelling. The thermographic nondestructive evaluation (NDE) rule-of-thumb that defects are detected if aspect ratio exceeds two is shown to have no general validity as peak contrast is found to depend critically on defect depth and absorbed excitation energy as well as defect aspect ratio. The effects of thermal diffusivity anisotropy are included in the analysis and illustrated by simulations of defect image contrast in composite materials.
Original languageEnglish
Article number093510
Number of pages9
JournalJournal of Applied Physics
Volume111
Issue number9
DOIs
Publication statusPublished - 1 May 2012

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