An analytical model for scanning-projection based stereolithography

Mohammad Mahdi Emami, Farshad Barazandeh, Farrokh Yaghmaie

Research output: Contribution to journalArticlepeer-review

32 Citations (SciVal)

Abstract

There is a growing need for effective small scale production methods. Projection stereolithography (PSL) is a technological response to such a demand. In PSL, Experience shows a decrease in resolution as area of exposure increases. A relatively novel hybrid method, scanning-projection stereolithography (SPSL) is presented in this work. This method is based on previous work by a number of authors, utilizing a combination of scanning and projection to manufacture large parts with relatively high-resolution. A modelling method to investigate the total energy received by individual pixels on resin surface is considered for both PSL and SPSL. The modelling shows near identical energy distribution for both methods. The modelling results were attempted to verify experimentally. Four patterns with circular and rectangular features were exposed with both methods. The resulting cured layers were compared via microscopic observation and measurements. Sample measurements show SPSL has a slightly better resolution using an inherently non-uniform exposure system. In large area exposure, SPSL provided less stitching and overlap issue.

Original languageEnglish
Pages (from-to)17-27
Number of pages11
JournalJournal of Materials Processing Technology
Volume219
Early online date9 Dec 2014
DOIs
Publication statusPublished - 1 May 2015

Keywords

  • Additive manufacturing
  • Digital micro-mirror
  • DMD
  • Dynamic mask
  • Large area exposure
  • Maskless stereolithography
  • Pixel based modelling

ASJC Scopus subject areas

  • Ceramics and Composites
  • Computer Science Applications
  • Metals and Alloys
  • Industrial and Manufacturing Engineering

Fingerprint

Dive into the research topics of 'An analytical model for scanning-projection based stereolithography'. Together they form a unique fingerprint.

Cite this