Adaptive phase measurement system for surface profile measurement

A J Pugh, W Houghton, M R Belmont, P R Shepherd, S R Pennock

Research output: Contribution to journalArticle

  • 2 Citations

Abstract

A hybrid phase measuring system is described which is an adaptive development of traditional phase locked loops. It is based around a digital delay line. The target application is a slope-measuring continuous wave lidar designed to determine surface profiles at shallow angles of incidence. The lidar unit, of which the phase shifter is a key element, is a pioneering system designed to obtain a vector field representation of propagating deep water ocean gravity waves. The application of the system is in the new discipline of deterministic sea wave prediction (DWSP) and is intended to operate in fixed time mode. In the normal tracking mode, the phase difference to be estimated is much less than pi/2, but however, due to the nature of the physical situation, sudden large jumps of several times pi are possible. The system time constants adapt to such jumps, producing an evolving compromise between phase error and the time taken to recover the tracking mode.
LanguageEnglish
Pages113-118
Number of pages6
JournalIEE Proceedings - Circuits Devices and Systems
Volume150
Issue number2
DOIs
StatusPublished - Apr 2003

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Phase measurement
Surface measurement
Optical radar
Gravity waves
Phase shifters
Water waves
Electric delay lines
Phase locked loops
Water

Cite this

Pugh, A. J., Houghton, W., Belmont, M. R., Shepherd, P. R., & Pennock, S. R. (2003). Adaptive phase measurement system for surface profile measurement. DOI: 10.1049/ip-cds:20030340

Adaptive phase measurement system for surface profile measurement. / Pugh, A J; Houghton, W; Belmont, M R; Shepherd, P R; Pennock, S R.

In: IEE Proceedings - Circuits Devices and Systems, Vol. 150, No. 2, 04.2003, p. 113-118.

Research output: Contribution to journalArticle

Pugh, A J ; Houghton, W ; Belmont, M R ; Shepherd, P R ; Pennock, S R. / Adaptive phase measurement system for surface profile measurement. In: IEE Proceedings - Circuits Devices and Systems. 2003 ; Vol. 150, No. 2. pp. 113-118
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