Achieving Invariability in Analog Circuits Operating in Extreme Environments

Peter Wilson, Robert Rudolf, Reuben Wilcock

Research output: Chapter or section in a book/report/conference proceedingChapter or section

Abstract

This chapter discusses some of the problems that can occur in the context of high variability and extreme environments for analog circuits, and some of the techniques that can be applied to resolve them. It introduces some interesting techniques for the reduction of variability generally, and a useful online calibration technique that offers the possibility of longer-term tolerance to variation and environmental conditions using configurable analog transistors. The key problem is the basic intrinsic variability of individual transistors. In the case of analog circuits, the impact of variability can be complex due to a large number of performance specifications. Mismatch variation can typically be lowered by careful layout of the matching devices by using standard techniques such as common centroid layout. By dynamically deriving the body bias voltage from circuit parameters, the technique can also be employed to increase robustness of the circuit against device parameter or bias condition variation.

Original languageEnglish
Title of host publicationExtreme Environment Electronics
EditorsJ. D. Cressler, H. A. Mantooth
Place of PublicationBoca Raton, U. S. A.
PublisherCRC Press
Pages509-517
Number of pages9
ISBN (Electronic)9781439874318
ISBN (Print)9781439874301
DOIs
Publication statusPublished - 1 Jan 2017

Bibliographical note

Publisher Copyright:
© 2013 by Taylor and Francis Group, LLC.

ASJC Scopus subject areas

  • Engineering(all)

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