A readout circuit implementation to reduce the flicker noise in MEMS electrothermal sensors

A. Mohammadi, Mehmet R. Yuce, S. O. R. Moheimani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The electrothermal displacement sensors are doped silicon resistors. The electrical current through the doped silicon generates flicker and thermal noise which degrades the sensitivity of these sensors. We propose an alternative readout method in which driving the silicon heaters with a high frequency voltage instead of a dc voltage leads to a lower flicker noise. The output of the sensor, in a simple wheatstone bridge configuration, is amplified by a low noise differential amplifier which attenuates the heating high frequency voltage as a common mode input. The proposed technique has been applied to a MEMS electrothermal sensor fabricated in the standard silicon on insulator (SOI) process. Experimental results demonstrate an 8dB improvement in SNR compared to the conventional measurement technique. The achieved noise floor is less than -100 dBVrms around the 20 Hz measured signal which translates to equation displacement noise in a MEMS nanopositioner.

Original languageEnglish
Title of host publication2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012
Pages121-124
Number of pages4
DOIs
Publication statusPublished - 19 Feb 2013
Event2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012 - Seville, Seville, Spain
Duration: 9 Dec 201212 Dec 2012

Conference

Conference2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012
CountrySpain
CitySeville, Seville
Period9/12/1212/12/12

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Mohammadi, A., Yuce, M. R., & Moheimani, S. O. R. (2013). A readout circuit implementation to reduce the flicker noise in MEMS electrothermal sensors. In 2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012 (pp. 121-124). [6463784] https://doi.org/10.1109/ICECS.2012.6463784