A computer controlled time resolved optical intensity profile measurement system

I. H. White; J. E. Carroll

doi:10.1016/0030-4018(83)90251-1

A computer controlled time resolved optical intensity profile measurement system

I. H. White, J. E. Carroll

Vice Chancellor's Office

University of Cambridge

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper, a computer controlled system is described, which provides data management and position control for time resolved measurement of near and far field, along with charge carrier concentration distributions of semiconductor lasers. Of particular interest is the manner in which microprocessor control of inexpensive motorised micrometers is used to provide accurate repeatable movements on submicron scales. Due to its noise reduction capability through computer averaging, this system has been operated in conjunction with a 50 ps risetime photodiode, and thus is believed to allow time resolved measurement on the shortest reported timescales. The system provides a further advantage in that experimental data may be stored to give easy access for further processing.

Original language	English
Pages (from-to)	289-294
Number of pages	6
Journal	Optics Communications
Volume	45
Issue number	5
DOIs	https://doi.org/10.1016/0030-4018(83)90251-1
Publication status	Published - 1 May 1983

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1016/0030-4018(83)90251-1

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A computer controlled time resolved optical intensity profile measurement system

Abstract

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