A computer controlled time resolved optical intensity profile measurement system

I. H. White, J. E. Carroll

Research output: Contribution to journalArticle

Abstract

In this paper, a computer controlled system is described, which provides data management and position control for time resolved measurement of near and far field, along with charge carrier concentration distributions of semiconductor lasers. Of particular interest is the manner in which microprocessor control of inexpensive motorised micrometers is used to provide accurate repeatable movements on submicron scales. Due to its noise reduction capability through computer averaging, this system has been operated in conjunction with a 50 ps risetime photodiode, and thus is believed to allow time resolved measurement on the shortest reported timescales. The system provides a further advantage in that experimental data may be stored to give easy access for further processing.

Original languageEnglish
Pages (from-to)289-294
Number of pages6
JournalOptics Communications
Volume45
Issue number5
DOIs
Publication statusPublished - 1 May 1983

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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