Abstract
Recent studies into the origins of failure of yttria partially stabilised zirconia-porcelain veneered prosthesis have revealed the importance of micro-to-nano scale characterisation of this interface zone. Current understanding suggests that the heat treatment, residual stresses and varying microstructure at this location may contribute to near-interface porcelain chipping. In this study the chemical, microstructural and mechanical property variation across the interfacial zone has been characterised at two differing length scales and using three independent techniques; energy dispersive X-ray spectroscopy, transmission electron microscopy and micropillar compression. Energy dispersive X-ray spectroscopy mapping of the near-interface region revealed, for the first time, that the diffusional lengths of twelve principal elements are limited to within 2-6 μm of the interface. This study also revealed that 0.2-2 μm diameter zirconia grains had become detached from the bulk and were embedded in the near-interface porcelain. Transmission electron microscopy analysis demonstrated the presence of nanoscale spherical features, indicative of tensile creep induced voiding, within the first 0.4-1.5 μm from the interface. Within zirconia, variations in grain size and atomistic structure were also observed within the 3 μm closest to the interface. Micropillar compression was performed over a 100 μm range on either side of the interface at the spatial resolution of 5 μm. This revealed an increase in zirconia and porcelain loading modulus at close proximities (< 5 μm) to the interface and a decrease in zirconia modulus at distances between 6 and 41 μm from this location. The combination of the three experimental techniques has revealed intricate details of the microstructural, chemical and consequently mechanical heterogeneities in the YPSZ-porcelain interface, and demonstrated that the length scales typically associated with this behaviour are approximately ± 5 μm.
Original language | English |
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Pages (from-to) | 222-232 |
Number of pages | 11 |
Journal | Thin Solid Films |
Volume | 596 |
Early online date | 1 Aug 2015 |
DOIs | |
Publication status | Published - 1 Dec 2015 |
Keywords
- Energy dispersive X-ray spectroscopy
- Micropillar compression/microcompression
- Scanning electron microscopy
- Transmission electron microscopy
- Yttria partially stabilised zirconia-porcelain interface
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry
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Alexander Lunt
- Department of Mechanical Engineering - Senior Lecturer
- Centre for Integrated Materials, Processes & Structures (IMPS)
- IAAPS: Propulsion and Mobility
Person: Research & Teaching, Core staff, Affiliate staff