A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance

A. Zarafshani, T. Qureshi, T. Bach, C. R. Chatwin, M. Soleimani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Assessment and validation of the Electrical Impedance Tomography (EIT) system performance and calibration of systematic errors in the electrical field generated inside of the interrogated volume is an important requirement. System instabilities can be caused by the EIT design and must be characterized before and during the clinical trials. Evaluation of the Sussex EIT system used in the clinical study can be based on a realistic electronic phantom. We designed a mesh phantom based on the electrode configuration and mesh structures of the image reconstruction. The phantom has the capability of modelling the cellular electrical properties that are operative within a circular homogeneous medium. The design is optimized to assess the planar topology of the internal impedance distribution. The system employs the information from the electrical properties of biological tissues to evaluate the Cole-Cole dispersion data. This mesh phantom is capable of producing localized conductivity perturbations between each arbitrary channel in the electrode placement planar phantom topology by measuring all 1416 combinations that are to be used in the image reconstruction. The phantom is especially designed for the Sussex EIT system to validate system performance of measurements consisting of SNR, and modelling system accuracy.

Original languageEnglish
Title of host publicationIEEE International Conference on Electro Information Technology, 2016
PublisherIEEE
Pages600-604
Number of pages5
ISBN (Print)9781467399852
DOIs
Publication statusPublished - 5 Aug 2016
Event2016 IEEE International Conference on Electro Information Technology, EIT 2016 - Grand Forks, USA United States
Duration: 19 May 201621 May 2016

Conference

Conference2016 IEEE International Conference on Electro Information Technology, EIT 2016
CountryUSA United States
CityGrand Forks
Period19/05/1621/05/16

Fingerprint

planar structures
electrical impedance
frequency response
mesh
tomography
image reconstruction
topology
electrical properties
electrodes
systematic errors
impedance
perturbation
conductivity
requirements
evaluation
configurations
electronics

Cite this

Zarafshani, A., Qureshi, T., Bach, T., Chatwin, C. R., & Soleimani, M. (2016). A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance. In IEEE International Conference on Electro Information Technology, 2016 (pp. 600-604). [7535306] IEEE. https://doi.org/10.1109/EIT.2016.7535306

A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance. / Zarafshani, A.; Qureshi, T.; Bach, T.; Chatwin, C. R.; Soleimani, M.

IEEE International Conference on Electro Information Technology, 2016. IEEE, 2016. p. 600-604 7535306.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zarafshani, A, Qureshi, T, Bach, T, Chatwin, CR & Soleimani, M 2016, A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance. in IEEE International Conference on Electro Information Technology, 2016., 7535306, IEEE, pp. 600-604, 2016 IEEE International Conference on Electro Information Technology, EIT 2016, Grand Forks, USA United States, 19/05/16. https://doi.org/10.1109/EIT.2016.7535306
Zarafshani A, Qureshi T, Bach T, Chatwin CR, Soleimani M. A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance. In IEEE International Conference on Electro Information Technology, 2016. IEEE. 2016. p. 600-604. 7535306 https://doi.org/10.1109/EIT.2016.7535306
Zarafshani, A. ; Qureshi, T. ; Bach, T. ; Chatwin, C. R. ; Soleimani, M. / A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance. IEEE International Conference on Electro Information Technology, 2016. IEEE, 2016. pp. 600-604
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