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2015
Learning Similarity Metrics for Dynamic Scene Segmentation
Teney, D., Brown, M., Kit, D. & Hall, P., 15 Oct 2015, IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2015. IEEE, p. 2084-2093 10 p. (2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)).Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding
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