SEM sample prep - Ion Miller (Leica EM RES 102)

Facility/equipment: Equipment

  • Location

    3 W 2.16F University of Bath Claverton Down Bath BA2 7AY

    UK United Kingdom

Equipments Details

Description

Material samples for TEM, Material samples for SEM, polymers, Cross section cutting, polishing for EBSD

Details

NameMake: LEICA; Model: EM RES102
Acquisition date30/06/16

Keywords

  • Electron microscopy
  • Sample prep
  • Ion miller

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