SEM sample prep - Ion Miller (Leica EM RES 102)

Facility/equipment: Equipment

  • Location

    3 W 2.16F University of Bath Claverton Down Bath BA2 7AY

    UK United Kingdom

Description

Material samples for TEM, Material samples for SEM, polymers, Cross section cutting, polishing for EBSD

Details

NameMake: LEICA; Model: EM RES102
Acquisition date30/06/16

Keywords

  • Electron microscopy
  • Sample prep
  • Ion miller