Field Emission Scanning Electron Microscope (FE-SEM)

    Facility/equipment: Equipment

    • Location

      3 W 2.16B University of Bath Claverton Down Bath BA2 7AY

      UK United Kingdom

    Equipments Details

    Description

    Field Emission scanning electron microscope FE-SEM (JEOL JSM-7900F) with attached UltiMax 170mm² Energy dispersive X-ray (EDX) detector (Oxford instruments), Ultim Extreme 100mm² EDX detector (Oxford Instruments) and a four segment scanning transmission electron microscopy (STEM) detector (Deben)

    Applications: Nano particles, nano tubes, biological samples, materials samples, Protein, bacteria, fungi, cement

    Details

    NameMake: JEOL; Model: JSM7900F
    Acquisition date30/09/20

    Equipment taxonomy

    • Scanning

    User-defined keywords

    • Electron microscopy
    • Field emission scanning electron microscope
    • FE-SEM
    Photo associated with equipment - P1020316.JPG

    Fingerprint

    Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.