This dataset contains the results of scanning electron microscopy (SEM) and transmission electron microscopy (TEM) measurements carried out on core-shell nanostructures. The samples are highly regular arrays of GaN plasma etched cores onto which thick InGaN layers were grown using different metal organic vapour phase epitaxy (MOVPE) growth parameters.
Three different InGaN growth conditions were considered with the following parameters: 750°C at 300 mbar, 700°C at 300 mbar and 750°C at 100 mbar. Statistical growth rates were determined on the non-polar crystal planes from measurements of increase in diameter using SEM images. TEM analysis was carried out on a single nanorod for greater detail.